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Journal List > Appl Microsc > v.45(1)

 
 
Regular Article
16 In Situ Transmission Electron Microscopy Study on the Reaction Kinetics of the Ni/Zr-interlayer/Ge System
Jae-Wook Lee, Jee-Hwan Bae, Tae-Hoon Kim, Keesam Shin, Je-Hyun Lee, Jung-il Song, Cheol-Woong Yang
Appl Microsc. 2015;45(1)16-22   Published online 2015 March 30
 DOI : https://doi.org/10.9729/AM.2015.45.1.16  SCID : SC000011191
Article       PubReader       ePub-4.6M       PDF-5.5M      
Regular Article
23 Dark-field Transmission Electron Microscopy Imaging Technique to Visualize the Local Structure of Two-dimensional Material; Graphene
Min Young Na, Seung-Mo Lee, Do Hyang Kim, Hye Jung Chang
Appl Microsc. 2015;45(1)23-31   Published online 2015 March 30
 DOI : https://doi.org/10.9729/AM.2015.45.1.23  SCID : SC000011194
Article       PubReader       ePub-11.3M       PDF-11.2M      
Regular Article
32 Microstructural Features of Multicomponent FeCoCrNiSix Alloys
Kyeong Ho Kong, Kang Cheol Kim, Won Tae Kim, Do Hyang Kim
Appl Microsc. 2015;45(1)32-36   Published online 2015 March 30
 DOI : https://doi.org/10.9729/AM.2015.45.1.32  SCID : SC000011198
Article       PubReader       ePub-3.4M       PDF-2.5M      
Regular Article
9 Microstructural Evolution in CuCrFeNi, CuCrFeNiMn, and CuCrFeNiMnAl High Entropy Alloys
Jae Ik Hyun, Kyeong Ho Kong, Kang Cheol Kim, Won Tae Kim, Do Hyang Kim
Appl Microsc. 2015;45(1)9-15   Published online 2015 March 30
 DOI : https://doi.org/10.9729/AM.2015.45.1.9  SCID : SC000011189
Article       PubReader       ePub-6.5M       PDF-4.5M      
Review Article
1 High Speed and Sensitive X-ray Analysis System with Automated Aberration Correction Scanning Transmission Electron Microscope
Hiromi Inada, Yoichi Hirayama, Keiji Tamura, Daisuke Terauchi, Ryoji Namekawa, Takeharu Shichiji, Takahiro Sato, Yuya Suzuki, Yoshihiro Ohtsu, Keitaro Watanabe, Mitsuru Konno, Hiroyuki Tanaka, Koichiro Saito, Wataru Shimoyama, Kuniyasu Nakamura, Kazutoshi Kaji, Takahito Hashimoto
Appl Microsc. 2015;45(1)1-8   Published online 2015 March 30
 DOI : https://doi.org/10.9729/AM.2015.45.1.1  SCID : SC000011190
Article       PubReader       ePub-7.3M       PDF-5.9M