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Journal List > Appl Microsc > v.45(4)

Regular Article
195 Preparation Method of Plan-View Transmission Electron Microscopy Specimen of the Cu Thin-Film Layer on Silicon Substrate Using the Focused Ion Beam with Gas-Assisted Etch
Ji-Soo Kim, Sang-Yeol Nam, Young-Hwan Choi, Ju-Cheol Park
Appl Microsc. 2015;45(4)195-198   Published online 2015 December 30
 DOI:   SCID: SC000013120
Article       PubReader       ePub-2.8M       PDF-1.8M      
Regular Article
230 Crystallography Analysis of the β-Mg17Al12 Precipitates by the Secondary Constrained Coincident Site Lattice Model
Xuefei Huang, Weigang Huang
Appl Microsc. 2015;45(4)230-235   Published online 2015 December 30
 DOI:   SCID: SC000013127
Article       PubReader       ePub-6.2M       PDF-4.2M      
Regular Article
236 Characterization and Electrical Conductivity of Carbon-Coated Metallic (Ni, Cu, Sn) Nanocapsules
Dong Xing Wang, Asif Shah, Lei Zhou, Xue Feng Zhang, Chun Jing Liu, Hao Huang, Xing Long Dong
Appl Microsc. 2015;45(4)236-241   Published online 2015 December 30
 DOI:   SCID: SC000013130
Article       PubReader       ePub-2.1M       PDF-504K      
Regular Article
242 Characterization of SiC/C Nanocomposite Powders Synthesized by Arc-Discharge
Lei Zhou, Jie Yi Yu, Jian Gao, Dong Xing Wang, Xiao Rong Gan, Fang Hong Xue, Hao Huang, Xing Long Dong
Appl Microsc. 2015;45(4)242-248   Published online 2015 December 30
 DOI:   SCID: SC000013129
Article       PubReader       ePub-3.1M       PDF-1.0M      
Regular Article
249 Scanning Electron Microscopic Study of Slime Formations in a Water Injection Station of Oil India Limited in Assam, India
Ranjan K. Bhagobaty, S. Purohit, M. C. Nihalani
Appl Microsc. 2015;45(4)249-253   Published online 2015 December 30
 DOI:   SCID: SC000013128
Article       PubReader       ePub-5.0M       PDF-838K      
Regular Article
254 The Structure of Visual Cells in the Retina of the Pond Loach, Misgurnus anguillicaudatus (Pisces; Cobitidae)
Chi-Hong Kim, Jae-Goo Kim, Jong-Young Park
Appl Microsc. 2015;45(4)254-258   Published online 2015 December 30
 DOI:   SCID: SC000013131
Article       PubReader       ePub-5.2M       PDF-1.4M      
Review Article
189 Cross-Sectional Transmission Electron Microscopy Specimen Preparation Technique by Backside Ar Ion Milling
Jung Ho Yoo, Jun-Mo Yang
Appl Microsc. 2015;45(4)189-194   Published online 2015 December 30
 DOI:   SCID: SC000013119
Article       PubReader       ePub-3.9M       PDF-2.5M      
Review Article
225 Atomic Resolution Scanning Transmission Electron Microscopy of Two-Dimensional Layered Transition Metal Dichalcogenides
Ning Lu, Jinguo Wang, Juan Pablo Oviedo, Guoda Lian, Moon Jea Kim
Appl Microsc. 2015;45(4)225-229   Published online 2015 December 30
 DOI:   SCID: SC000013126
Article       PubReader       ePub-3.9M       PDF-1.3M      
Technical Report
199 Transmission Electron Microscopy Sample Preparation of Ge2Sb2Te5 Nanowire Using Electron Beam
Hee-Sun Lee, Jun-Young Lee, Jong-Souk Yeo
Appl Microsc. 2015;45(4)199-202   Published online 2015 December 30
 DOI:   SCID: SC000013121
Article       PubReader       ePub-2.5M       PDF-563K      
Technical Report
203 Transmission Electron Microscope Sampling Method for Three-Dimensional Structure Analysis of Two-Dimensional Soft Materials
Sang-Gil Lee, Ji-Hyun Lee, Seung Jo Yoo, Suvo Jit Datta, In-Chul Hwang, Kyung-Byung Yoon, Jin-Gyu Kim
Appl Microsc. 2015;45(4)203-207   Published online 2015 December 30
 DOI:   SCID: SC000013122
Article       PubReader       ePub-8.1M       PDF-2.4M      
Technical Report
208 Advanced Methodologies for Manipulating Nanoscale Features in Focused Ion Beam
Yang-Hee Kim, Jong-Hyun Seo, Ji Yeong Lee, Jae-Pyoung Ahn
Appl Microsc. 2015;45(4)208-213   Published online 2015 December 30
 DOI:   SCID: SC000013123
Article       PubReader       ePub-7.2M       PDF-1.2M      
Technical Report
214 Specimen Preparation for Scanning Electron Microscope Using a Converted Sample Stage
Hyelan Kim, Hyo-Sik Kim, Seungmin Yu, Tae-Sung Bae
Appl Microsc. 2015;45(4)214-217   Published online 2015 December 30
 DOI:   SCID: SC000013124
Article       PubReader       ePub-3.3M       PDF-1.0M      
Technical Report
218 Technical Overview on the Electron Backscattered Diffraction Sample Preparation
Dong-Ik Kim, Byung-Kyu Kim, Ju-Heon Kim
Appl Microsc. 2015;45(4)218-224   Published online 2015 December 30
 DOI:   SCID: SC000013125
Article       PubReader       ePub-14.9M       PDF-17.4M