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Journal List > Appl Microsc > v.46(4)

 
 
Regular Article
193 Effects of Short-Term Treatment with Estrogen Receptor Agonist on Morphological Changes in Reproductive Organs of Adult Male Mice
Hayana Choi, Yun Jeong Mo, Mi-Kyung Lee, Eun Sang Choe, Sung Tae Yee, Hyun Wook Cho
Appl Microsc. 2016;46(4)193-200   Published online 2016 December 30
 DOI: https://doi.org/10.9729/AM.2016.46.4.193   SCID: SC000022030
Article       PubReader       ePub-11.1M       PDF-2.5M      
Regular Article
201 Water Wetting Observation on a Superhydrophobic Hairy Plant Leaf Using Environmental Scanning Electron Microscopy
Sun Mi Yoon, Tae-Jun Ko, Kyu Hwan Oh, Sahn Nahm, Myoung-Woon Moon
Appl Microsc. 2016;46(4)201-205   Published online 2016 December 30
 DOI: https://doi.org/10.9729/AM.2016.46.4.201   SCID: SC000022033
Article       PubReader       ePub-7.6M       PDF-1.2M      
Regular Article
227 Epoxylite Influence on Field Electron Emission Properties of Tungsten and Carbon Fiber Tips
Shady S Alnawasreh, Ala’a M Al-Qudah, Mazen A Madanat, Emad S Bani Ali, Ayman M Almasri, Marwan S Mousa
Appl Microsc. 2016;46(4)227-237   Published online 2016 December 30
 DOI: https://doi.org/10.9729/AM.2016.46.4.227   SCID: SC000022036
Article       PubReader       ePub-6.2M       PDF-1.7M      
Regular Article
238 Transmission Electron Microscopy Observation of Twin Variant Selection in Austenitic Twinning-Induced Plasticity Steel
Jung-Hoon Han, Juhyun Oh, Sangmoon Yoon, Yanghoo Kim, Heung Nam Han, Miyoung Kim
Appl Microsc. 2016;46(4)238-243   Published online 2016 December 30
 DOI: https://doi.org/10.9729/AM.2016.46.4.238   SCID: SC000022038
Article       PubReader       ePub-4.6M       PDF-1.6M      
Regular Article
244 Switch-on Phenomena and Field Emission from Multi-Walled Carbon Nanotubes Embedded in Glass
Emad S Bani Ali, Marwan S Mousa
Appl Microsc. 2016;46(4)244-252   Published online 2016 December 30
 DOI: https://doi.org/10.9729/AM.2016.46.4.244   SCID: SC000022037
Article       PubReader       ePub-7.5M       PDF-2.1M      
Review Article
171 Nano-Resolution Connectomics Using Large-Volume Electron Microscopy
Gyu Hyun Kim, Ja Won Gim, Kea Joo Lee
Appl Microsc. 2016;46(4)171-175   Published online 2016 December 30
 DOI: https://doi.org/10.9729/AM.2016.46.4.171   SCID: SC000022028
Article       PubReader       ePub-2.1M       PDF-1.0M      
Review Article
176 Light-Microscopy-Based Sparse Neural Circuit Reconstruction: Array Tomography and Other Methods
Jong-Cheol Rah
Appl Microsc. 2016;46(4)176-178   Published online 2016 December 30
 DOI: https://doi.org/10.9729/AM.2016.46.4.176   SCID: SC000022027
Article       PubReader       ePub-651K       PDF-593K      
Review Article
179 Brain Mapping Using Neuroimaging
Woo-Suk Tae, Shin-Hyuk Kang, Byung-Joo Ham, Byung-Jo Kim, Sung-Bom Pyun
Appl Microsc. 2016;46(4)179-183   Published online 2016 December 30
 DOI: https://doi.org/10.9729/AM.2016.46.4.179   SCID: SC000022029
Article       PubReader       ePub-3.3M       PDF-1.3M      
Review Article
184 Brain Mapping: From Anatomics to Informatics
Woong Sun
Appl Microsc. 2016;46(4)184-187   Published online 2016 December 30
 DOI: https://doi.org/10.9729/AM.2016.46.4.184   SCID: SC000022032
Article       PubReader       ePub-66K       PDF-192K      
Review Article
188 How to Get Well-Preserved Samples for Transmission Electron Microscopy
Chang-Hyun Park, Hyun-Wook Kim, Im Joo Rhyu, Chang-Sub Uhm
Appl Microsc. 2016;46(4)188-192   Published online 2016 December 30
 DOI: https://doi.org/10.9729/AM.2016.46.4.188   SCID: SC000022031
Article       PubReader       ePub-104K       PDF-210K      
Review Article
206 Transmission Electron Microscopy on Memristive Devices: An Overview
Julian Strobel, Krishna Kanth Neelisetty, Venkata Sai Kiran Chakravadhanula, Lorenz Kienle
Appl Microsc. 2016;46(4)206-216   Published online 2016 December 30
 DOI: https://doi.org/10.9729/AM.2016.46.4.206   SCID: SC000022034
Article       PubReader       ePub-4.4M       PDF-1.8M      
Review Article
217 Probing the Atomic Structures of Synthetic Monolayer and Bilayer Hexagonal Boron Nitride Using Electron Microscopy
Roland Yingjie Tay, Jinjun Lin, Siu Hon Tsang, Dougal G. McCulloch, Edwin Hang Tong Teo
Appl Microsc. 2016;46(4)217-226   Published online 2016 December 30
 DOI: https://doi.org/10.9729/AM.2016.46.4.217   SCID: SC000022035
Article       PubReader       ePub-13.6M       PDF-6.6M